
\[I_{out} = D_{in} \times I_{ref}\text{ [I]}\]
\[t_{out} = D_{in} \times t_{ref}\text{ [s]}\]
\[Q_{out} = D_{in} \times Q_{ref}\text{ [C]}\]
\[V_{out} = D_{in} \times V_{ref}\text{ [V]}\]
\[R_{out} = D_{in} \times R_{ref}\text{ [}\Omega\text{]}\]
The digital value is dimensionless, as such, there must be a reference value
Digital to analog conversion can be indirect through the relations between voltage, resistance, current, time, inductance and capacitance.
\[V = R I\]
\(Q = C V\)
\[dt = \frac{C dV}{I}\]
\[dt = \frac{L dI}{V}\]
\[I_{ref} = \frac{V_{ref}}{3 R}\]
\[V_{out} = D_{in} R I_{ref} = \frac{D_{in} R V_{ref}}{3 R} \text{ [V]}\]
\[V_{out} = \frac{b_0 2 R V_{ref}}{3 R} + \frac{\overline{b_0} R V_{ref}}{3 R}\]
\[V_{out} = \begin{cases} \frac{2}{3} V_{ref}, & b_0 = 1 \\ \frac{1}{3} V_{ref}, & b_0 = 0 \end{cases}\]
\[I_{ref} = \frac{V_{ref}}{2 R}\]
\[V_{out} = \frac{b_0 2 R V_{ref}}{2 R} + \frac{\overline{b_0} R V_{ref}}{2 R}\]
\[V_{out} = \begin{cases} V_{ref}, & b_0 = 1 \\ \frac{1}{2} V_{ref}, & b_0 = 0 \end{cases}\]
| b | Vo/Vr | Vo/Vr |
|---|---|---|
| 00 | 1/4 | 0/4 |
| 01 | 2/4 | 1/4 |
| 10 | 3/4 | 2/4 |
| 11 | 4/4 | 3/4 |
What is correct?
Digital to analog converters do not add quantization error. The quantization error is already in the digital word.
\[V_{out} = B + a_1 D_{in} + \left( a_2 D_{in}^2 + \dots + a_n D_{in}^n \right)\]
DAC output will contain gain errors, offset errors, and non-linear components
\[DNL[k] = \frac{V[k+1] - V[k]}{V_{LSB}} - 1\]
\[INL[k] = \frac{V[k] - V_{ideal}[k]}{V_{LSB}}\]
As number of resistors grow, the switches grow as
\[\sum_{n=1}^{N} 2^n = 2^{N+1} - 2\]
Give every tap a switch onto a column line, and every column line a switch to the output. For \(2^N\) taps in a square arrangement that is
\[2^{N} + 2^{N/2}\]
Switches in a 10-bit digital to analog converter.
\[\begin{array}{lll} \text{Tree} & 2^{N+1}-2 & = 2046 \\ \text{Matrix} & 2^{N} + 2^{N/2} & = 1056 \\ \text{Two strings, 6b + 4b} & 2^{M} + 2^{N-M} & = 80 \\ \text{Two strings, 5b + 5b} & 2^{M} + 2^{N-M} & = 64 \end{array}\]
Large number of bits, will be large number of resistors and switches.
\[R_{in} = 2R \parallel 2R = R\]
\[R_{in} = R + R = 2R\]
\[I_{0} = \frac{V_0}{2R} = \frac{V_1}{4R}\]
\[R_{in} = 2R \parallel 2R = R\]
\[I_{0} = \frac{V_0}{2R} = \frac{V_1}{4R}\]
\[I_{1} = \frac{V_1}{2R}\]
\[I_{RF} = I_1b_1 + I_0b_0 = \frac{V_{REF}}{2R}b_1 + \frac{V_{REF}}{4R}b_0\]
\[V_{O} = \left(\frac{V_{REF}}{2R}b_1 + \frac{V_{REF}}{4R}b_0\right)R_{F0}\]
For 4 states (2-bit) there are 12 possible transitions
Assume MSB first (left)
\[1 \rightarrow 3 \rightarrow 2\]
Assume LSB first (right)
\[1 \rightarrow 0 \rightarrow 2\]
Both cause a non-monotonic glitch during transition.
The sequence of MSB to LSB does not matter.
\[0 \rightarrow 1 \rightarrow 2 \rightarrow 3\]
\[I_{out} = D_{in} \times I_{ref}\text{ [I]}\]
\[V_{out} = D_{in} \times V_{ref}\text{ [V]}\]
\[R_{out} = D_{in} \times R_{ref}\text{ [}\Omega\text{]}\]
\[t_{out} = D_{in} \times t_{ref}\text{ [s]}\]
\[Q_{out} = D_{in} \times Q_{ref}\text{ [C]}\]
\[V = R I\]
\(Q = C V\)
\[dt = \frac{C dV}{I}\]
\[dt = \frac{L dI}{V}\]
A 28-nm 75-fsrms Analog Fractional-N Sampling PLL With a Highly Linear DTC Incorporating Background DTC Gain Calibration and Reference Clock Duty Cycle Correction [@wu19]
A 10-bit Charge-Redistribution ADC Consuming 1.9 uW at 1 MS/s [@elzakker10]
A 6.3 uW 20 bit Incremental Zoom-ADC with 6 ppm INL and 1 uV Offset [@chae13]
A 12-Bit 1.25-GS/s DAC in 90 nm CMOS With >70 dB SFDR up to 500 MHz [@tseng11]